Particles Plus Supports EIA 2017

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Orlando, FL – March 27, 2017– Particles Plus will be attending and exhibiting at the 34th Annual Conference and Exhibition of the Environmental Information Association this week. The event is being held at the Rosen Shingle Creek Resort in Orlando Florida and promises to provide education, technical presentations, product demonstrations and networking opportunities.

The Annual EIA Conference & Exposition is the source for information on mold identification and remediation, environmental sampling and analysis, indoor air quality, regulatory compliance audits, environmental site assessments, and environmental management systems. Particles Plus will be showcasing their high quality handheld particle counters with unique features designed specifically for indoor air quality investigations and audits. They will also be demonstrating their AQM Series air quality monitors that combine accurate particle measurement with additional air quality environmental parameters such as Carbon Dioxide (CO2), total volatile organic compounds (TVOC), temperature and humidity.

“The EIA’s National Conference has been driven to educate IAQ and remediation professionals, and they strive to ensure that practical, real world information and the latest technologies are available to their attendees,” notes Tom Grillo of Particles Plus. “We look forward to supporting the EIA and their efforts to provide the latest technologies to their members. Our products fit in perfectly with their practices and offer the best options and features for their purpose.

Visit Particles Plus at booth 104 in Orlando, or for more information on Particles Plus Air Monitoring Instruments and their applications, or for technical questions, product specifications or pricing, contact Particles Plus today.